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Tektronix Oscilloscopes - DSA8200 Digital Serial Analyzer Sampling Oscilloscope

DSA8200 Digital Serial Analyzer Sampling Oscilloscope

The DSA8200 digital serial analyzer sampling oscilloscope is the first tool to provide complete Serial Data Link Analysis (SDLA) capability and remains your time- and cost-effective choice for signal path characterization.

As the leader in the market for TDR-based solutions, the DSA8200 gives you the greatest performance for serial data network analysis applications - TDR performance, S-parameter bandwidth, signal fidelity, and RMS noise. And as the leader, it also gives you the versatility for characterization and conformance testing of emerging high-speed computer and communications electrical and optical signals.

Features & Benefits

  • First complete Serial Data Link Analysis capability with 80SJNB 

  • Industry-leading Timebase Jitter Performance <200 fsRMS 

  • Highest Performance Integrated TDR/TDT - 12 ps incident rise time 

  • S-parameter Measurements 

Simple and speedy S-parameter measurements: the DSA8200 vs. the VNA. Watch the video
300k/DSL or faster | 100k/ISDN | 56k/Modem

Performance Specifications

Model

Bandwidth 

Sample Rate

Channels 

DSA8200   DC - 70+ GHz 200 kS/s (sequential) Up to 8 

Features & Benefits

  • State of the Art Sampling Oscilloscope for Communication Signal Analysis, TDR/TDT/Serial Data Network Analysis, Acquisition and Measurements of Repetitive Ultrafast Signals 

    • Acquisition of Spread Spectrum Clocking (SSC) signals 

    • Industry’s Only Mainframe to Support up to 8 Input Channels for Increased Flexibility and Throughput 

    • Four Color Graded, Variable Persistence Waveform Databases 

    • Measurement System with Over 100 Automated Measurements 

    • Complete Suite of Communications Measurements Includes Both Types of OMA, SSC Profile, and Many Others 

    • Automated ITU/ANSI/IEEE Mask Testing 

    • Masks and Measurements for SONET/SDH, FC, Ethernet and Other Standards Built-in 

    • Mask Updates Can be Loaded from Factory-Supplied File 

    • Mask Margin Testing for Guard Banding Production Testing 

  • Acquisition Modules 

    • Fully Integrated Multi-rate Optical Modules 

    • Optical Modules up to 80+GHz 80C10B*1 

    • High Accuracy "ER Calibrated" Measurement Available in Some Modules 

    • Electrical Modules to 70+ GHz Bandwidth and 5 ps Measured Rise Time (10-90%) 

    • Flexible Rate Clock Recovery 

    • Clock Recovery with SSC (Spread Spectrum Clocking) Support Available 

  • Jitter, Noise, BER and Serial Data Link Analysis 

    • Measures and Separates Deterministic Data Dependent Jitter from Random Jitter 

    • Measures Vertical Noise Separating Deterministic Data Dependent Noise from Random Noise 

    • Highly Accurate BER and Eye Contour Estimation 

    • FFE/DFE Equalization 

    • Channel Emulation 

    • Linear Filter for Fixture De-embedding, Linear Filtering 

  • TDR (Time Domain Reflectometry) 

    • Up to 50 GHz TDR Bandwidth with 15 ps Reflected Rise Time and 12 ps Incident Rise Time 

    • Lowest Noise for Accurate Repeatable TDR Measurement Results – 600 μVRMS at 50 GHz 

    • Independent Sampler Deskew Ensures Easy Fixture and Probe De-embedding 

    • Industry’s Only Mainframe to Accommodate up to Four True Differential TDR or Electrical Channel Pairs for Increased System Versatility 

  • S-parameters Measurements 

    • Up to 50 GHz Differential, Single Ended, Mixed-Mode; Insertion, Return Loss, Frequency Domain Crosstalk 

    • PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing and Standard Compliance Testing for Gigabit Signal Path and Interconnects – Including Eye Mask Tests 

    • Intuitive, Easy and Accurate for Serial Data, Gigabit Digital Design and Signal Integrity 

    • Fast and Accurate Automated Multi-port S-parameter Measurements with Command Line Interface 

  • Industry’s Best Standard Timebase Jitter Performance, 800 fsRMS 

  • Industry Leading Timebase Jitter Performance, <200 fsRMS*2 Available with Phase Reference Mode 

  • Fast Acquisition Rate and High Throughput 

  • True Differential Remote Sampler Enabling Placement Near DUT for Superior Signal Fidelity 

  • FrameScan™ Acquisition Mode with Eye Diagram Averaging: 

    • Isolate Data Dependent Faults 

    • Examine Low-power Signals 

  • MS Windows XP Operating System 

  • Advanced Connectivity to 3rd party Software 

Accessories

  • P80318 18 GHz 100 Ω Differential Impedance TDR Hand Probe
    This probe enables high fidelity impedance measurements of differential transmission lines.

  • P8018 20 GHz Single-ended TDR Hand Probe
    For electrical sampling TDR circuit board impedance characterization and high-speed electrical signal analysis applications.

  • 80A03 TekConnect® Probe Interface
    80A03 Interfaces P7000 Series high-performance active and differential probes to DSA8200 series sampling scopes.

Using and Learning

View more detailed specifications in the Data Sheet  (352 KB).


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